JPH0331233B2 - - Google Patents

Info

Publication number
JPH0331233B2
JPH0331233B2 JP58048236A JP4823683A JPH0331233B2 JP H0331233 B2 JPH0331233 B2 JP H0331233B2 JP 58048236 A JP58048236 A JP 58048236A JP 4823683 A JP4823683 A JP 4823683A JP H0331233 B2 JPH0331233 B2 JP H0331233B2
Authority
JP
Japan
Prior art keywords
scan
data
parity
clock
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58048236A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59173778A (ja
Inventor
Atsushi Ishikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP58048236A priority Critical patent/JPS59173778A/ja
Publication of JPS59173778A publication Critical patent/JPS59173778A/ja
Publication of JPH0331233B2 publication Critical patent/JPH0331233B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP58048236A 1983-03-23 1983-03-23 スキヤンパス回路 Granted JPS59173778A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58048236A JPS59173778A (ja) 1983-03-23 1983-03-23 スキヤンパス回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58048236A JPS59173778A (ja) 1983-03-23 1983-03-23 スキヤンパス回路

Publications (2)

Publication Number Publication Date
JPS59173778A JPS59173778A (ja) 1984-10-01
JPH0331233B2 true JPH0331233B2 (en]) 1991-05-02

Family

ID=12797804

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58048236A Granted JPS59173778A (ja) 1983-03-23 1983-03-23 スキヤンパス回路

Country Status (1)

Country Link
JP (1) JPS59173778A (en])

Also Published As

Publication number Publication date
JPS59173778A (ja) 1984-10-01

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